Photon-driven degradation processes in GaN-based optoelectronic devices

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Photon-driven degradation processes in GaN-based optoelectronic devices

Archive ouverte : Communication dans un congrès

Edité par HAL CCSD

International audience

Langue: Anglais

Date de publication: 2019-07-07

Source: 13th International Conference on Nitride Semiconductors 2019 (ICNS-13)

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