[Invited] Challenges to measure RF noise and intermodulation performances of mmW/THz devices

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[Invited] Challenges to measure RF noise and intermodulation performances of mmW/THz devices

Archive ouverte : Communication dans un congrès

Edité par HAL CCSD

International audience. Applications in millimetre wave range and terahertz frequencies keep on increasing. In this context, drastic challenges are faced at measurement level, in particular to extract noise performance and nonlinear properties of devices and circuits used to build the required systems. The aim of this talk is to provide an overview of these challenges, and to describe the solutions that we have developed to respond to them.

Langue: Anglais

Date de publication: 2022-07-04

Source: IEEE Latin American Electron Devices Conference (LAEDC 2022)

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