Atomic force microscopy as a suitable tool for probing the polar axis direction in electroactive P(VDF-co-TrFE) films at the nanoscale | Mohan, M.M. Saj
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Atomic force microscopy as a suitable tool for probing the polar axis direction in electroactive P(VDF-co-TrFE) films at the nanoscale

Archive ouverte : Communication dans un congrès

Mohan, M.M. Saj | Costa, Antonio Da | Tahon, Jean-François | Bouad, Vincent | Hamieh, Ahmad | Addad, Ahmed | Marin, Adeline | Cazaux, Frédéric | Ponchel, Freddy | Lefebvre, Jean-Marc | Ladmiral, Vincent | Remiens, Denis | Desfeux, Rachel | Barrau, Sophie | Ferri, Anthony

Edité par HAL CCSD

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