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Degradation of InGaN-based optoelectronic devices under electrical and optical stress

Archive ouverte : Communication dans un congrès

de Santi, Carlo | Meneghini, Matteo | Caria, Alessandro | Renso, Nicola | Dogmus, Ezgi | Zegaoui, Malek | Medjdoub, F | Zanoni, Enrico | Meneghesso, Gaudenzio

Edité par HAL CCSD

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